Invention Grant
- Patent Title: Response to wearout in an electronic device
- Patent Title (中): 响应电子设备中的烦恼
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Application No.: US13500700Application Date: 2009-11-06
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Publication No.: US08698552B2Publication Date: 2014-04-15
- Inventor: Michael Priel , Anton Rozen , Yossi Shoshany
- Applicant: Michael Priel , Anton Rozen , Yossi Shoshany
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- International Application: PCT/IB2009/054942 WO 20091106
- International Announcement: WO2011/055169 WO 20110512
- Main IPC: G05F1/10
- IPC: G05F1/10

Abstract:
An electronic device comprises a first component susceptible to a wearout effect, operation of which first component depends on an operating parameter, and a second component having an on-state and an off-state. The electronic device further comprises a time estimator for updating an estimate of an accumulated time the second component was in the on-state; and a controller for controlling the operating parameter on the basis of the accumulated time estimate so as to respond to the expected wearout effect. The first component and the second component may be the same, or the first component may have an on-state correlated to the on-state of the second component. The operating parameter may, for example, be a level or amplitude or correction value of one of the following: a voltage applied at the first component, an electric current fed to the first component, and a power provided to the first component. A method of operating such an electronic device is also disclosed.
Public/Granted literature
- US20120206183A1 RESPONSE TO WEAROUT IN AN ELECTRONIC DEVICE Public/Granted day:2012-08-16
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