Invention Grant
- Patent Title: Device interface apparatus and test apparatus
- Patent Title (中): 设备接口设备和测试设备
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Application No.: US13196866Application Date: 2011-08-02
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Publication No.: US08699018B2Publication Date: 2014-04-15
- Inventor: Hideo Hara , Shin Masuda
- Applicant: Hideo Hara , Shin Masuda
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Priority: JP2010-176973 20100806
- Main IPC: G01N21/01
- IPC: G01N21/01

Abstract:
It is an object of the present invention to test a device under test including an optical interface. Provided is a device interface apparatus on which is loaded a device under test including an optical interface. The device interface apparatus comprises a device loading section on which the device under test is loaded; an optical connector that is to be connected to the optical interface of the device under test; and an optical connector moving section that moves the optical connector toward the optical interface of the device under test loaded on the device loading section, to optically connect the optical connector and the optical interface.
Public/Granted literature
- US20120033208A1 DEVICE INTERFACE APPARATUS AND TEST APPARATUS Public/Granted day:2012-02-09
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