Invention Grant
- Patent Title: Sequence calibration method and sequence calibration device
- Patent Title (中): 序列校准方法和序列校准装置
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Application No.: US12974872Application Date: 2010-12-21
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Publication No.: US08700340B2Publication Date: 2014-04-15
- Inventor: Bai-Kuang Hwang , Jenn-Yeh Fann , Chao-Chi Pan
- Applicant: Bai-Kuang Hwang , Jenn-Yeh Fann , Chao-Chi Pan
- Applicant Address: TW Hsinchu
- Assignee: Industrial Technology Research Institute
- Current Assignee: Industrial Technology Research Institute
- Current Assignee Address: TW Hsinchu
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Main IPC: G06F19/00
- IPC: G06F19/00 ; C12Q1/68 ; G06F19/22

Abstract:
The invention provides a sequence calibration method, including: (a) obtaining a first reading sequence and a second reading sequence from an identical source by a receiving unit; (b) setting a comparison condition by a determining unit; and (c) comparing the first reading sequence with the second reading sequence according to the comparison condition to generate a sequence comparison result by the determining unit; and (d) outputting a calibrated sequence according to the sequence comparison result by the determining unit, wherein the comparison condition is set according to a first seed table of the first reading sequence and a second seed table of the second reading sequence.
Public/Granted literature
- US20110153249A1 SEQUENCE CALIBRATION METHOD AND SEQUENCE CALIBRATION DEVICE Public/Granted day:2011-06-23
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