Invention Grant
US08700346B2 Device for measuring and processing a high dynamic input signal, and corresponding leak detector and measuring and processing method
有权
用于测量和处理高动态输入信号的装置,以及相应的泄漏检测器和测量和处理方法
- Patent Title: Device for measuring and processing a high dynamic input signal, and corresponding leak detector and measuring and processing method
- Patent Title (中): 用于测量和处理高动态输入信号的装置,以及相应的泄漏检测器和测量和处理方法
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Application No.: US13144082Application Date: 2010-01-11
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Publication No.: US08700346B2Publication Date: 2014-04-15
- Inventor: Pascal Jourdan
- Applicant: Pascal Jourdan
- Applicant Address: FR Annecy
- Assignee: Adixen Vacuum Products
- Current Assignee: Adixen Vacuum Products
- Current Assignee Address: FR Annecy
- Agency: Sughrue Mion, PLLC
- Priority: FR0900109 20090112
- International Application: PCT/FR2010/050037 WO 20100111
- International Announcement: WO2010/079312 WO 20100715
- Main IPC: G01F17/00
- IPC: G01F17/00

Abstract:
The invention relates to a device for measuring and processing an input signal (To) of at least two decades, comprising: an electron multiplier (4) that has an exponential gain on the basis of the power supply voltage (Vm) thereof and which receives said input signal (To); a power supply (5) that provides the power supply voltage (Vm) of said multiplier (4); a control circuit (6) of the power supply (5), the gain (10) and shift (11) parameters of which are adjustable and define an output signal range while varying the exponential gain of said multiplier (4); a logarithmic compression amplifier (T), the output of which is received as an input of the control circuit (6) so as to vary the exponential gain of the electron multiplier (4), in a continuous manner over the dynamic range of a measurement, on the basis of the output signal (IoG) of the electron multiplier (4), and forming the output signal (Vout) of said device; a measuring and calculating means for predetermining the value of the exponent (b) for the exponential gain of the electron multiplier (4) and for calculating the gain (10) and shift (11) parameter values of said control circuit (6) on the basis of the value of said predetermined exponent (b). The invention also relates to a corresponding leak detector and measuring and processing method.
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