Invention Grant
- Patent Title: Method for generating performance evaluation model
- Patent Title (中): 产生绩效评估模型的方法
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Application No.: US12289759Application Date: 2008-11-03
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Publication No.: US08700380B2Publication Date: 2014-04-15
- Inventor: Yoichiro Kumazaki
- Applicant: Yoichiro Kumazaki
- Applicant Address: JP Yokohama
- Assignee: Fujitsu Semiconductor Limited
- Current Assignee: Fujitsu Semiconductor Limited
- Current Assignee Address: JP Yokohama
- Agency: Staas & Halsey LLP
- Priority: JP2007-318093 20071210
- Main IPC: G06F9/455
- IPC: G06F9/455

Abstract:
A method for generating performance evaluation model may be provided which executes, by using first models of function modules which are described in a transaction level, a first simulation of system operation at the transaction level between the function modules, records transactions which are generated in the first simulation per function module, executes, by using second models of the function modules which are described in a hardware level, a second simulation of circuit operation of each of the function modules to determine a delay time of each function module of the recorded transactions, and assigns information of the delay time to the first model and generating a third model per function module.
Public/Granted literature
- US20090150137A1 Method for generating performance evaluation model Public/Granted day:2009-06-11
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