Invention Grant
- Patent Title: Feature analyzing apparatus for a surface of an object
- Patent Title (中): 用于物体表面的特征分析装置
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Application No.: US12745384Application Date: 2008-12-01
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Publication No.: US08700498B2Publication Date: 2014-04-15
- Inventor: Yoshinori Hayashi , Hiroshi Wakaba , Koichi Miyazono , Yoko Ono , Hideki Mori
- Applicant: Yoshinori Hayashi , Hiroshi Wakaba , Koichi Miyazono , Yoko Ono , Hideki Mori
- Applicant Address: JP Yokohama-shi
- Assignee: Shibaura Mechatronics Corporation
- Current Assignee: Shibaura Mechatronics Corporation
- Current Assignee Address: JP Yokohama-shi
- Agency: Kratz, Quintos & Hanson, LLP
- Priority: JP2007-314088 20071205
- International Application: PCT/JP2008/071784 WO 20081201
- International Announcement: WO2009/072458 WO 20090611
- Main IPC: G06Q10/00
- IPC: G06Q10/00

Abstract:
A feature analysis apparatus which enables visual confirmation of features of an inspected object and which enables limitations on the degree of freedom of classification based on the features to made relatively smaller is provided. It acquires inspected object information of an inspected object (S1), analyzes the inspection information to determine values of feature parameters of each of the plurality of layers (S2 to S5), uses values of the plurality of feature parameters and their corresponding directions for each of the plurality of layers to generate a single parameter vector (S2 to S5), converts the parameter vector to a layer vector which is a 3D vector in a predetermined (S2 to S5), and couples the plurality of layer vectors obtained for the plurality of layers in the order of the layers and generates a set of coordinate values of the plurality of nodes obtained in the 3D space as feature information of the inspected object (S6).
Public/Granted literature
- US20100310150A1 FEATURE ANALYZING APPARATUS Public/Granted day:2010-12-09
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