Invention Grant
- Patent Title: Air flow measuring device
- Patent Title (中): 气流测量装置
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Application No.: US13540765Application Date: 2012-07-03
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Publication No.: US08701474B2Publication Date: 2014-04-22
- Inventor: Hiroshi Tagawa
- Applicant: Hiroshi Tagawa
- Applicant Address: JP Kariya
- Assignee: Denso Corporation
- Current Assignee: Denso Corporation
- Current Assignee Address: JP Kariya
- Agency: Nixon & Vanderhye P.C.
- Priority: JP2011-150665 20110707
- Main IPC: G01M15/04
- IPC: G01M15/04

Abstract:
An air flow measuring device includes a housing, a sensor, and a projection portion. The housing defines a bypass flow passage through which taken-in intake air passes and which has an outlet that opens into an intake passage toward a downstream side of a mainstream of intake air. The sensor is accommodated in the bypass flow passage to produce an electrical signal as a result of heat transfer between the taken-in intake air and the sensor. The projection portion is provided on an outer wall of the housing on a downstream side of the outlet in the mainstream and extends outward of the housing. A projection-portion projected region and an outlet projected region, which are formed respectively by projecting the projection portion and the outlet perpendicularly onto a projection plane that is perpendicular to a direction of the mainstream, overlap with each other.
Public/Granted literature
- US20130008243A1 AIR FLOW MEASURING DEVICE Public/Granted day:2013-01-10
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