Invention Grant
- Patent Title: Direction selection mechanism for analytical tool, and analytical device
- Patent Title (中): 分析仪器和分析仪器的方向选择机构
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Application No.: US11628176Application Date: 2005-06-01
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Publication No.: US08703054B2Publication Date: 2014-04-22
- Inventor: Hidenari Yamagata
- Applicant: Hidenari Yamagata
- Applicant Address: JP Kyoto-shi
- Assignee: ARKRAY, Inc.
- Current Assignee: ARKRAY, Inc.
- Current Assignee Address: JP Kyoto-shi
- Agency: Fox Rothschild LLP
- Priority: JP2004-164983 20040602
- International Application: PCT/JP2005/010079 WO 20050601
- International Announcement: WO2005/119268 WO 20051215
- Main IPC: G01N21/13
- IPC: G01N21/13

Abstract:
The present invention relates to analytical apparatus comprising: a passage (45) in which an analytical tool (2) is moved from above to below; and a movement block (51), made capable of reciprocatory movement in the horizontal directions (D1, D2), for moving the analytical tool (2) incoming through the passage (45) in the direction (D1). This analytical apparatus is constructed such that, by erecting the analytical tool (2) on the movement block (51) positioned directly below the outlet (45B) of the passage (45) and causing the movement block (51) to move in the D1 or D2 direction, the analytical tool (2) is tipped over, and the analytical tool (2) is placed in a horizontal condition on the movement block (51).
Public/Granted literature
- US20070231212A1 Direction Selection Mechanism for Analytical Tool, and Analytical Device Public/Granted day:2007-10-04
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