Invention Grant
- Patent Title: Methods of forming a material layer and methods of fabricating a memory device
- Patent Title (中): 形成材料层的方法和制造存储器件的方法
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Application No.: US12465975Application Date: 2009-05-14
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Publication No.: US08703237B2Publication Date: 2014-04-22
- Inventor: Hye-young Park , Sung-lae Cho , Jin-il Lee , Do-hyung Kim , Dong-hyun Im
- Applicant: Hye-young Park , Sung-lae Cho , Jin-il Lee , Do-hyung Kim , Dong-hyun Im
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Myers Bigel Sibley & Sajovec, P.A.
- Priority: KR10-2008-0045072 20080515
- Main IPC: C23C16/00
- IPC: C23C16/00 ; B05D5/12

Abstract:
Provided are methods of forming a material layer by chemically adsorbing metal atoms to a substrate having anions formed on the surface thereof, and a method of fabricating a memory device by using the material layer forming method. Accordingly, a via hole with a small diameter can be filled with a material layer without forming voids or seams. Thus, a reliable memory device can be obtained.
Public/Granted literature
- US20090285986A1 METHODS OF FORMING A MATERIAL LAYER AND METHODS OF FABRICATING A MEMORY DEVICE Public/Granted day:2009-11-19
Information query
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