Invention Grant
- Patent Title: MOS capacitors with a finFET process
- Patent Title (中): 具有finFET工艺的MOS电容器
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Application No.: US13471955Application Date: 2012-05-15
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Publication No.: US08703553B2Publication Date: 2014-04-22
- Inventor: Kangguo Cheng , Balasubramanian S. Haran , Shom Ponoth , Theodorus E. Standaert , Tenko Yamashita
- Applicant: Kangguo Cheng , Balasubramanian S. Haran , Shom Ponoth , Theodorus E. Standaert , Tenko Yamashita
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Tutunjian & Bitetto, P.C.
- Agent Vazken Alexanian
- Main IPC: H01L21/8234
- IPC: H01L21/8234 ; H01L27/12

Abstract:
Methods for capacitor fabrication include doping a capacitor region of a semiconductor layer in a semiconductor-on-insulator substrate; partially etching the semiconductor layer to produce a first terminal layer comprising doped semiconductor fins on a remaining base of doped semiconductor; forming a dielectric layer over the first terminal layer; and forming a second terminal layer over the dielectric layer in a finFET process.
Public/Granted literature
- US20130309832A1 MOS CAPACITORS WITH A FINFET PROCESS Public/Granted day:2013-11-21
Information query
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