Invention Grant
- Patent Title: Creation of vias and trenches with different depths
- Patent Title (中): 创造不同深度的通道和沟渠
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Application No.: US13415164Application Date: 2012-03-08
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Publication No.: US08703604B2Publication Date: 2014-04-22
- Inventor: Shom Ponoth , David V. Horak , Takeshi Nogami , Chih-Chao Yang
- Applicant: Shom Ponoth , David V. Horak , Takeshi Nogami , Chih-Chao Yang
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Yuanmin Cai
- Main IPC: H01L21/311
- IPC: H01L21/311 ; H01L21/3065

Abstract:
Embodiments of the invention provide a method of creating vias and trenches with different length. The method includes depositing a plurality of dielectric layers on top of a semiconductor structure with the plurality of dielectric layers being separated by at least one etch-stop layer; creating multiple openings from a top surface of the plurality of dielectric layers down into the plurality of dielectric layers by a non-selective etching process, wherein at least one of the multiple openings has a depth below the etch-step layer; and continuing etching the multiple openings by a selective etching process until one or more openings of the multiple openings that are above the etch-stop layer reach and expose the etch-stop layer. Semiconductor structures made thereby are also provided.
Public/Granted literature
- US20120171859A1 CREATION OF VIAS AND TRENCHES WITH DIFFERENT DEPTHS Public/Granted day:2012-07-05
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