Provided is a test apparatus that tests a device under test, comprising a power supply section that generates a power supply voltage to be supplied to the device under test; an inductive load section provided in a path between the power supply section and the device under test; a plurality of semiconductor switches connected in series in a path between the inductive load section and the device under test; and a control section that turns OFF the semiconductor switches when a supply of voltage to the device under test is stopped.