Invention Grant
- Patent Title: Inspection apparatus and measuring method
- Patent Title (中): 检验仪器及测量方法
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Application No.: US12859579Application Date: 2010-08-19
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Publication No.: US08704890B2Publication Date: 2014-04-22
- Inventor: Fumio Hori
- Applicant: Fumio Hori
- Applicant Address: JP Tokyo
- Assignee: Olympus Corporation
- Current Assignee: Olympus Corporation
- Current Assignee Address: JP Tokyo
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Main IPC: H04N7/18
- IPC: H04N7/18

Abstract:
An inspection apparatus includes: an insertion portion which is inserted into a device under inspection; a projection unit which projects a striped pattern including a plurality of linear patterns onto an object; an imaging unit which is provided in the insertion portion and images the object onto which the striped pattern is projected and generates image data; a specification unit which specifies an area of interest of the object in an image based on a position of the striped pattern in the image based on the image data; and a measurement unit which measures the area of the object using the image data.
Public/Granted literature
- US20120044349A1 INSPECTION APPARATUS AND MEASURING METHOD Public/Granted day:2012-02-23
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