Invention Grant
- Patent Title: Timing phase detection using a matched filter set
- Patent Title (中): 使用匹配滤波器组的定时相位检测
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Application No.: US12205811Application Date: 2008-09-05
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Publication No.: US08705673B2Publication Date: 2014-04-22
- Inventor: David Noeldner
- Applicant: David Noeldner
- Applicant Address: US CA San Jose
- Assignee: LSI Corporation
- Current Assignee: LSI Corporation
- Current Assignee Address: US CA San Jose
- Agency: Hamilton DeSanctis & Cha
- Main IPC: H03D1/04
- IPC: H03D1/04

Abstract:
Various embodiments of the present invention provide systems and methods for phase identification in data processing systems. As one example, a circuit is disclosed that includes a bank of matched filters with two or more matched filters tuned to detect patterns corresponding to a timing pattern sampled using different phases of a sample clock. In particular, the bank of matched filters includes at least a first matched filter tuned to detect a first pattern corresponding to the timing pattern sampled using a first phase of a sample clock, and a second matched filter tuned to detect a second pattern corresponding to the timing pattern sampled using a second phase of the sample clock. The circuits further include a logic circuit operable to determine whether the sample clock is closer to the first phase or the second phase based on an output of the first matched filter and an output of the second matched filter.
Public/Granted literature
- US20100061490A1 Timing Phase Detection Using a Matched Filter Set Public/Granted day:2010-03-11
Information query
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