Invention Grant
- Patent Title: Region of interest determination for X-ray imaging
- Patent Title (中): X射线成像感兴趣区域测定
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Application No.: US12953274Application Date: 2010-11-23
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Publication No.: US08705695B2Publication Date: 2014-04-22
- Inventor: Kadri Nizar Jabri , Vivek Walimbe , Rowland Saunders , Romain Areste
- Applicant: Kadri Nizar Jabri , Vivek Walimbe , Rowland Saunders , Romain Areste
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: Fletcher Yoder, P.C.
- Main IPC: G01N23/04
- IPC: G01N23/04

Abstract:
A radiography system allow for user determination of a region of interest on a subject prior to X-ray exposure. The region of interest is defined by user interaction with an image, a pointer system, or the like. The region of interest is then translated to the imaging coordinate system, such as in the plane of a digital detector. The region is then used for exposure control during an imaging sequence, either in an open or closed-loop manner.
Public/Granted literature
- US20120128125A1 REGION OF INTEREST DETERMINATION FOR X-RAY IMAGING Public/Granted day:2012-05-24
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