Invention Grant
US08705846B2 Position measuring apparatus, position measuring method, image processing apparatus and image processing method
有权
位置测量装置,位置测量方法,图像处理装置和图像处理方法
- Patent Title: Position measuring apparatus, position measuring method, image processing apparatus and image processing method
- Patent Title (中): 位置测量装置,位置测量方法,图像处理装置和图像处理方法
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Application No.: US13213303Application Date: 2011-08-19
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Publication No.: US08705846B2Publication Date: 2014-04-22
- Inventor: Tomohide Ishigami , Akio Nishimura , Tetsuro Okuyama
- Applicant: Tomohide Ishigami , Akio Nishimura , Tetsuro Okuyama
- Applicant Address: JP Osaka
- Assignee: Panasonic Corporation
- Current Assignee: Panasonic Corporation
- Current Assignee Address: JP Osaka
- Agency: Wenderoth, Lind & Ponack, L.L.P.
- Priority: JP2010-184599 20100820
- Main IPC: G06T15/06
- IPC: G06T15/06

Abstract:
A position measuring apparatus which measures a position of a position measurement target easily and accurately without using any parameter inside a camera in the measurement, based on images captured from mutually different viewpoints. The position measuring apparatus which measures the three-dimensional position of the position measurement target, based on the input images captured from the mutually different viewpoints, and the position measuring apparatus includes: a ray information storage unit configured to store ray information in which each of ray vectors is associated with a corresponding one of pixels in one of the input images, each of the ray vectors indicating a forward direction of a light incident onto an optical system for a corresponding one of the input images; and a position measuring unit configured to measure the three-dimensional position of the position measurement target, using the ray information stored in the ray information storage unit.
Public/Granted literature
Information query
IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T15/00 | 3D〔三维〕图像的加工 |
G06T15/06 | .光线跟踪 |