Invention Grant
US08707114B2 Semiconductor device including a test circuit that generates test signals to be used for adjustment on operation of an internal circuit
失效
包括测试电路的半导体器件，该测试电路产生用于在内部电路的操作上进行调整的测试信号
- Patent Title: Semiconductor device including a test circuit that generates test signals to be used for adjustment on operation of an internal circuit
- Patent Title (中): 包括测试电路的半导体器件，该测试电路产生用于在内部电路的操作上进行调整的测试信号
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Application No.: US13071121Application Date: 2011-03-24
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Publication No.: US08707114B2Publication Date: 2014-04-22
- Inventor: Hiromasa Noda
- Applicant: Hiromasa Noda
- Priority: JPP2010-072393 20100326
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
A semiconductor device includes a decoder, a first register unit, and a second register unit. The decoder generates first and second register control signals in response to an external test code signal. The first register unit is coupled to the decoder. The first register unit receives the first register control signal from the decoder. The first register unit outputs in series a plurality of test signals in response to the first register control signal. The second register unit is coupled to the first register unit. The second register unit receives the first and second register control signals from the decoder. The second register unit receives in series the plurality of test signals from the first register unit in response to the first register control signal. The second register unit outputs in parallel the plurality of test signals in response to the second register control signal.
Public/Granted literature
- US20110239062A1 SEMICONDUCTOR DEVICE Public/Granted day:2011-09-29
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