Invention Grant
- Patent Title: System for verifying temperature measurement
- Patent Title (中): 用于验证温度测量的系统
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Application No.: US13373859Application Date: 2011-12-02
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Publication No.: US08708553B2Publication Date: 2014-04-29
- Inventor: Michael G. Colburn , Stephen J. Bogner , David R. McCloskey , Gavin McCormick
- Applicant: Michael G. Colburn , Stephen J. Bogner , David R. McCloskey , Gavin McCormick
- Applicant Address: US CT Middlefield
- Assignee: Cooper-Atkins Corporation
- Current Assignee: Cooper-Atkins Corporation
- Current Assignee Address: US CT Middlefield
- Agent Thomas G. Ference
- Main IPC: G01K15/00
- IPC: G01K15/00

Abstract:
The present application is directed to a system for verifying calibration of a temperature sensor comprising an above-ambient temperature verifier and a below-ambient temperature verifier. The above-ambient temperature verifier includes a first housing containing an ohmic material. At least one pair of electrodes is provided to direct an applied current through the ohmic material to heat the material. A well is provided within the ohmic material for accepting a temperature sensor. A compression assembly cooperates with the ohmic material to create intimate contact with the temperature sensor. An above-ambient reference temperature monitor maintains a calibrated temperature within the ohmic material. The below-ambient temperature verifier includes a second housing and a below-ambient reference temperature monitor to maintain a calibrated temperature of a below-ambient temperature medium. The system further includes the ability to log all temperature test measurements from an RFID tag located on each temperature sensor to be verified.
Public/Granted literature
- US20120140789A1 System for verifying temperature measurement Public/Granted day:2012-06-07
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