Invention Grant
- Patent Title: Semiconductor memory device
- Patent Title (中): 半导体存储器件
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Application No.: US13425860Application Date: 2012-03-21
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Publication No.: US08711632B2Publication Date: 2014-04-29
- Inventor: Akira Katayama
- Applicant: Akira Katayama
- Applicant Address: JP Tokyo
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2011-075562 20110330
- Main IPC: G11C11/34
- IPC: G11C11/34

Abstract:
The control circuit selects, as the first reference cell, the first memory cell having a maximum reading current supplied by turning on the first select transistor in a state in which resistance values of the first memory cells are all increased. The control circuit selects, as the second reference cell, the second memory cell having a maximum reading current supplied by turning on the second select transistor in a state in which resistance values of the second memory cells are all increased. The first reference-current setting circuit sets, as the first reference current, a current obtained by adding a first adjusting current to the reading current of the first reference cell. The second reference-current setting circuit sets, as the second reference current, a current obtained by adding a second adjusting current to the reading current of the second reference cell.
Public/Granted literature
- US20120250400A1 SEMICONDUCTOR MEMORY DEVICE Public/Granted day:2012-10-04
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