Invention Grant
US08711632B2 Semiconductor memory device 有权
半导体存储器件

Semiconductor memory device
Abstract:
The control circuit selects, as the first reference cell, the first memory cell having a maximum reading current supplied by turning on the first select transistor in a state in which resistance values of the first memory cells are all increased. The control circuit selects, as the second reference cell, the second memory cell having a maximum reading current supplied by turning on the second select transistor in a state in which resistance values of the second memory cells are all increased. The first reference-current setting circuit sets, as the first reference current, a current obtained by adding a first adjusting current to the reading current of the first reference cell. The second reference-current setting circuit sets, as the second reference current, a current obtained by adding a second adjusting current to the reading current of the second reference cell.
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