Invention Grant
- Patent Title: Measurement protocol for a medical technology apparatus
- Patent Title (中): 一种医疗技术装置的测量方案
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Application No.: US12971338Application Date: 2010-12-17
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Publication No.: US08712714B2Publication Date: 2014-04-29
- Inventor: Wilhelm Horger , Andre De Oliveira
- Applicant: Wilhelm Horger , Andre De Oliveira
- Applicant Address: DE
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE
- Agency: Schiff Hardin LLP
- Priority: DE102009054990 20091218
- Main IPC: G01C19/00
- IPC: G01C19/00

Abstract:
In a method and a computer-readable storage medium to optimize protocol parameters for an MR measurement protocol, the user can configure conditions for selected physical parameters in advance. Moreover, it is possible to configure rules for these parameters and/or for the conditions. In a next step physical values regarding the selected parameters are measured. The measured values are then applied to the configured conditions and/or rules in order to optimize the protocol parameters.
Public/Granted literature
- US20110153255A1 MEASUREMENT PROTOCOL FOR A MEDICAL TECHNOLOGY APPARATUS Public/Granted day:2011-06-23
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