Invention Grant
- Patent Title: Simulation parameter correction technique
- Patent Title (中): 模拟参数校正技术
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Application No.: US13052243Application Date: 2011-03-21
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Publication No.: US08713489B2Publication Date: 2014-04-29
- Inventor: Hiroyuki Higuchi , Hidetoshi Matsuoka
- Applicant: Hiroyuki Higuchi , Hidetoshi Matsuoka
- Applicant Address: JP Kawasaki
- Assignee: Fujitsu Limited
- Current Assignee: Fujitsu Limited
- Current Assignee Address: JP Kawasaki
- Agency: Staas & Halsey LLP
- Priority: JP2010-125218 20100531
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G01R27/28 ; G01R31/10 ; G01R31/14

Abstract:
A parameter correction method includes: obtaining, from a variability-aware simulation, a simulation result value of a predetermined product performance for a reference candidate value set concerning statistics of predetermined product characteristics; calculating a likelihood by substituting the reference candidate value set, the obtained simulation result value, statistics of measurement values of the predetermined product characteristics and a measurement value of the predetermined product performance into a likelihood function that is defined from a probability density function for the statistics of the predetermined product characteristics and a probability density function for the predetermined product performance, and is a function to calculate a combined likelihood of the statistics of the predetermined product characteristics and the predetermined product performance; and searching for a reference candidate value set in case where the calculated likelihood becomes maximum, by carrying out the obtaining and the calculating plural times while changing the reference candidate value set.
Public/Granted literature
- US20110295403A1 SIMULATION PARAMETER CORRECTION TECHNIQUE Public/Granted day:2011-12-01
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