Invention Grant
- Patent Title: Qualification screening system and screening method thereof, qualification screening device and device under qualification screening
- Patent Title (中): 资格审查制度及其筛选方法,资格筛选装置和资质筛选装置
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Application No.: US11683207Application Date: 2007-03-07
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Publication No.: US08713673B2Publication Date: 2014-04-29
- Inventor: Hiroshi Kitamura
- Applicant: Hiroshi Kitamura
- Applicant Address: JP Tokyo
- Assignee: NEC Corporation
- Current Assignee: NEC Corporation
- Current Assignee Address: JP Tokyo
- Agency: Sughrue Mion, PLLC
- Priority: JP2006-096881 20060331
- Main IPC: G06F15/173
- IPC: G06F15/173 ; G06F9/445

Abstract:
The present invention provides a qualification screening system which is capable of performing qualification screening on a device under qualification screening using a status of information to be updated that is retained by the device under qualification screening without having to know concrete procedures or methods for updating such information. A qualification screening device estimates the status of information to be updated that is retained by the device under qualification screening from a time at which an information update program that updates the information to be updated, which is independent of update procedures or methods, was activated and update processing was last updated, and compares the information with a time of a scheduled issuance of information to be updated, retained in qualification screening condition information of the qualification screening device itself, to perform qualification screening. A common time at which information exchange was performed between the qualification screening device and the device under qualification screening is used as reference in order to perform an effective comparison using time information among devices that are not synchronized.
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Information query