Invention Grant
- Patent Title: System and method for detecting surface perturbations
- Patent Title (中): 用于检测表面扰动的系统和方法
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Application No.: US13045173Application Date: 2011-03-10
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Publication No.: US08714023B2Publication Date: 2014-05-06
- Inventor: Jeffrey B. Sampsell
- Applicant: Jeffrey B. Sampsell
- Applicant Address: US CA San Diego
- Assignee: Qualcomm MEMS Technologies, Inc.
- Current Assignee: Qualcomm MEMS Technologies, Inc.
- Current Assignee Address: US CA San Diego
- Agency: Knobbe, Martens, Olson & Bear, LLP
- Main IPC: G01B7/16
- IPC: G01B7/16

Abstract:
This disclosure provides systems, methods and apparatus for assessing a surface using a piezoelectric element. In one aspect, the method includes applying a device to the surface, wherein the device includes at least one piezoelectric element and at least one EMS device, wherein the EMS device includes a conductive first layer separated from a conductive second layer, and wherein the piezoelectric element is electrically coupled to the EMS device such that a force applied to the piezoelectric element results in a voltage applied across the first and second layers.
Public/Granted literature
- US20120229121A1 SYSTEM AND METHOD FOR DETECTING SURFACE PERTURBATIONS Public/Granted day:2012-09-13
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