Invention Grant
- Patent Title: Dummy for testing rack size
- Patent Title (中): 虚拟测试机架尺寸
-
Application No.: US13081470Application Date: 2011-04-06
-
Publication No.: US08714036B2Publication Date: 2014-05-06
- Inventor: Bing-Jun Zhang
- Applicant: Bing-Jun Zhang
- Applicant Address: CN Shenzhen TW New Taipei
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: CN201110071937 20110324
- Main IPC: G01B3/46
- IPC: G01B3/46

Abstract:
A dummy for testing whether sizes of receiving spaces for receiving electrical elements in an enclosure are suitable or not. The dummy includes a frame and a handle attached to the frame. The frame includes a bottom wall. A number of wheels are rotatably attached to opposite ends of the bottom wall. Thereby, the frame is slidably received in the enclosure. A width and a height of the frame are respectively equal to minimum values of a width and height of one of the receiving spaces.
Public/Granted literature
- US20120240693A1 DUMMY FOR TESTING RACK SIZE Public/Granted day:2012-09-27
Information query