Invention Grant
- Patent Title: Methods and apparatus for automated measuring of the interventricular septum thickness
- Patent Title (中): 用于自动测量室间隔厚度的方法和装置
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Application No.: US12825755Application Date: 2010-06-29
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Publication No.: US08715183B2Publication Date: 2014-05-06
- Inventor: Navneeth Subramanian , Anand Magadi Narasimhamurthy , Sheshadri Thiruvenkadam , Dirk Ryan Padfield
- Applicant: Navneeth Subramanian , Anand Magadi Narasimhamurthy , Sheshadri Thiruvenkadam , Dirk Ryan Padfield
- Applicant Address: US NY Niskayuna
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Niskayuna
- Agent Scott J. Asmus
- Main IPC: A61B8/00
- IPC: A61B8/00

Abstract:
A method for automatically measuring interventricular septum thickness is provided. The method in one embodiment comprises acquiring a series of ultrasound images of a heart, acquiring a septum mask by applying a septum segmentation algorithm on the series of ultrasound images, localizing a mitral valve tip using a valve tip localization algorithm and calculating the thickness of the interventricular septum using an interventricular septum thickness algorithm. The interventricular septum thickness algorithm uses the septum mask and the localized mitral valve tip as inputs.
Public/Granted literature
- US20110319763A1 METHODS AND APPARATUS FOR AUTOMATED MEASURING OF THE INTERVENTRICULAR SEPTUM THICKNESS Public/Granted day:2011-12-29
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