Invention Grant
- Patent Title: Surface processing method
- Patent Title (中): 表面处理方法
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Application No.: US13655785Application Date: 2012-10-19
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Publication No.: US08715782B2Publication Date: 2014-05-06
- Inventor: Naoyuki Satoh , Nobuyuki Nagayama , Keiichi Nagakubo
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2009-163418 20090710
- Main IPC: C23C16/32
- IPC: C23C16/32

Abstract:
In a surface processing method for processing a surface of a member made of silicon carbide (SiC) and having a fragmental layer on a surface thereof, the surface of the member having the fragmental layer is modified into a dense layer to reduce the number of particles generated from the surface of the member when the member is applied to a plasma processing apparatus. Here, the SiC of the surface of the member is recrystallized by heating the fragmental layer.
Public/Granted literature
- US20130040055A1 SURFACE PROCESSING METHOD Public/Granted day:2013-02-14
Information query
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