Invention Grant
- Patent Title: Nonvolatile memory cell and method of manufacturing the same
- Patent Title (中): 非易失性存储单元及其制造方法
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Application No.: US14022705Application Date: 2013-09-10
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Publication No.: US08716035B2Publication Date: 2014-05-06
- Inventor: Sung Min Yoon , Chun Won Byun , Shin Hyuk Yang , Sang Hee Park , Soon Won Jung , Seung Youl Kang , Chi Sun Hwang , Byoung Gon Yu
- Applicant: Electronics and Telecommunications Research Institute
- Applicant Address: KR Daejeon
- Assignee: Electronics and Telecommunications Research Institute
- Current Assignee: Electronics and Telecommunications Research Institute
- Current Assignee Address: KR Daejeon
- Agency: Rabin & Berdo, P.C.
- Priority: KR10-2009-0078459 20090825; KR10-2010-0029135 20100331
- Main IPC: H01L51/00
- IPC: H01L51/00

Abstract:
Provided are a nonvolatile memory cell and a method of manufacturing the same. The nonvolatile memory cell includes a memory transistor and a driver transistor. The memory transistor includes a semiconductor layer, a buffer layer, an organic ferroelectric layer, and a gate electrode, which are disposed on a substrate. The driver transistor includes the semiconductor layer, the buffer layer, a gate insulating layer, and the gate electrode, which are disposed on the substrate. The memory transistor and the driver transistor are disposed on the same substrate. The nonvolatile memory cell is transparent in a visible light region.
Public/Granted literature
- US20140011297A1 NONVOLATILE MEMORY CELL AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2014-01-09
Information query
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