Invention Grant
- Patent Title: Charged particle optical system, drawing apparatus, and method of manufacturing article
- Patent Title (中): 带电粒子光学系统,拉丝装置和制造方法
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Application No.: US13835154Application Date: 2013-03-15
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Publication No.: US08716672B2Publication Date: 2014-05-06
- Inventor: Kentaro Sano , Masato Muraki , Akira Miyake , Yoshikiyo Yui
- Applicant: Canon Kabushiki Kaisha
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Rossi, Kimms & McDowell LLP
- Priority: JP2012-092478 20120413; JP2013-014833 20130129
- Main IPC: H01J3/14
- IPC: H01J3/14 ; H01J3/12 ; H01J1/46

Abstract:
The present invention provides a charged particle optical system which emits a charged particle beam, the system including an electrostatic lens, and a grid electrode opposed to the electrostatic lens along an optical axis of the electrostatic lens, and configured to form an electrostatic field in cooperation with the electrostatic lens, wherein the grid electrode is configured such that an electrode surface, opposed to the electrostatic lens, of the grid electrode has a distance, from the electrostatic lens in a direction of the optical axis, which varies with a position in the electrode surface.
Public/Granted literature
- US20130273478A1 CHARGED PARTICLE OPTICAL SYSTEM, DRAWING APPARATUS, AND METHOD OF MANUFACTURING ARTICLE Public/Granted day:2013-10-17
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