Invention Grant
- Patent Title: Eddy current probe for surface and sub-surface inspection
- Patent Title (中): 用于表面和表面检查的涡流探头
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Application No.: US13457687Application Date: 2012-04-27
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Publication No.: US08717012B2Publication Date: 2014-05-06
- Inventor: Russell A. Wincheski , John W. Simpson
- Applicant: Russell A. Wincheski , John W. Simpson
- Applicant Address: US DC Washington
- Assignee: The United States of America as respresented by the United States National Aeronautics and Space Administration
- Current Assignee: The United States of America as respresented by the United States National Aeronautics and Space Administration
- Current Assignee Address: US DC Washington
- Agent Andrea Z. Warmbier
- Main IPC: G01N27/72
- IPC: G01N27/72 ; G01N27/82 ; G01R33/14 ; G01R33/00 ; G01B7/16

Abstract:
An eddy current probe includes an excitation coil for coupling to a low-frequency alternating current (AC) source. A magnetoresistive sensor is centrally disposed within and at one end of the excitation coil to thereby define a sensing end of the probe. A tubular flux-focusing lens is disposed between the excitation coil and the magnetoresistive sensor. An excitation wire is spaced apart from the magnetoresistive sensor in a plane that is perpendicular to the sensor's axis of sensitivity and such that, when the sensing end of the eddy current probe is positioned adjacent to the surface of a structure, the excitation wire is disposed between the magnetoresistive sensor and the surface of the structure. The excitation wire is coupled to a high-frequency AC source. The excitation coil and flux-focusing lens can be omitted when only surface inspection is required.
Public/Granted literature
- US20120274319A1 Eddy Current Probe for Surface and Sub-Surface Inspection Public/Granted day:2012-11-01
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