Invention Grant
- Patent Title: Magnetic field detection apparatus and measurement apparatus
- Patent Title (中): 磁场检测装置及测量装置
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Application No.: US12708259Application Date: 2010-02-18
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Publication No.: US08717017B2Publication Date: 2014-05-06
- Inventor: Mutsumi Suzuki , Nobuyasu Kanekawa , Masamichi Yamada
- Applicant: Mutsumi Suzuki , Nobuyasu Kanekawa , Masamichi Yamada
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- Priority: JP2009-045026 20090227
- Main IPC: G01R33/02
- IPC: G01R33/02

Abstract:
There has been a problem that a bridge circuit using magneto-resistive elements or transducer elements could output a signal including an offset voltage, which could result in lower measurement accuracy. In order to solve such a problem, half-bridges each having magneto-resistive elements or transducer elements are excited with different excitation voltages so that the offset voltage is eliminated and the measurement accuracy is improved.
Public/Granted literature
- US20100219822A1 Magnetic Field Detection Apparatus and Measurement Apparatus Public/Granted day:2010-09-02
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