Invention Grant
- Patent Title: Electromagnetic generating device for testing electromagnetic compatibility
- Patent Title (中): 用于测试电磁兼容性的电磁发生装置
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Application No.: US13087381Application Date: 2011-04-15
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Publication No.: US08717039B2Publication Date: 2014-05-06
- Inventor: Cheng-Sung Wang
- Applicant: Cheng-Sung Wang
- Applicant Address: TW New Taipei
- Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: TW100106111A 20110224
- Main IPC: G01R27/28
- IPC: G01R27/28

Abstract:
An electromagnetic generating device is used for testing an electromagnetic interference of electronic elements of an electronic device. The electromagnetic generating device includes a power source and a detector. The power source includes a power output. The detector includes a first magnetic guiding portion, a second guiding portion, and an electronic coil. The first magnetic guiding portion is connected to the second magnetic guiding portion. The electronic coil surrounds the second magnetic guiding portion. The electronic coil includes an input coupled to the power output of the power source, and an output being grounded.
Public/Granted literature
- US20120217979A1 ELECTROMAGNETIC GENERATING DEVICE FOR TESTING ELECTROMAGNETIC COMPATIBILITY Public/Granted day:2012-08-30
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