Invention Grant
- Patent Title: Method and apparatus for accurately measuring currents using on chip sense resistors
- Patent Title (中): 使用片上感测电阻精确测量电流的方法和装置
-
Application No.: US12760174Application Date: 2010-04-14
-
Publication No.: US08717051B2Publication Date: 2014-05-06
- Inventor: Patrick Sullivan
- Applicant: Patrick Sullivan
- Applicant Address: US CA Milpitas
- Assignee: Intersil Americas Inc.
- Current Assignee: Intersil Americas Inc.
- Current Assignee Address: US CA Milpitas
- Agency: Fogg & Powers LLC
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R1/20

Abstract:
Systems and methods for managing process and temperature variations for on-chip sense resistors are disclosed. The system includes a circuit that can leverage a linear gm circuit in order to provide linear gains (positive gains and/or negative gains). The linearity of the circuit enables compensation for temperature and process variations across an entire range of current (positive to negative). A control signal is generated by using a linear gm amplifier and a replica resistor, which is substantially similar to the on chip resistor. The control signal is used to control the gain of a disparate linear gm amplifier within a compensation circuit, which provides an offset voltage to compensate for the variation in resistance of the on chip resistor.
Public/Granted literature
- US20110095818A1 METHOD AND APPARATUS FOR ACCURATELY MEASURING CURRENTS USING ON CHIP SENSE RESISTORS Public/Granted day:2011-04-28
Information query