Invention Grant
- Patent Title: Blemish detection sytem and method
- Patent Title (中): 瑕疵检测系统和方法
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Application No.: US12962577Application Date: 2010-12-07
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Publication No.: US08717465B2Publication Date: 2014-05-06
- Inventor: Wen-Min Ning
- Applicant: Wen-Min Ning
- Applicant Address: TW New Taipei
- Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: TW99115047 20100512
- Main IPC: H04N9/64
- IPC: H04N9/64

Abstract:
An image blemish detecting system includes an image capturing module, a brightness adjusting module, and a blemish detecting module. The image capturing module captures an image. The brightness adjusting module adjusts the brightness of the image to obtain a second image having substantially uniform brightness. The blemish detecting module calculates a brightness ratio of each pixel in the second image, marks the pixels of which the brightness ratios are not smaller than a predetermined reference value as “1”, and marks the other pixels as “0”. The blemish detecting module calculates the quantity of the pixels in a continuous area in which all pixels are marked as “1”, and determines that the continuous area is a blemish if the quantity of the pixels in the continuous area is greater than or equal to the predetermined pixel quantity.
Public/Granted literature
- US20110279715A1 BLEMISH DETECTION SYTEM AND METHOD Public/Granted day:2011-11-17
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