Invention Grant
- Patent Title: Exposure apparatus, and device manufacturing method
- Patent Title (中): 曝光装置和装置制造方法
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Application No.: US13853643Application Date: 2013-03-29
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Publication No.: US08717537B2Publication Date: 2014-05-06
- Inventor: Akimitsu Ebihara
- Applicant: Nikon Corporation
- Applicant Address: JP Tokyo
- Assignee: Nikon Corporation
- Current Assignee: Nikon Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2003-174259 20030619
- Main IPC: G03B27/42
- IPC: G03B27/42 ; G03B27/52 ; G03F7/20

Abstract:
Exposure apparatus and methods expose a substrate with an energy beam via a projection optical system and has first and second tables on each of which a substrate is mountable. A mark detection system is arranged in a second area different from a first area in which the projection optical system is arranged. A substrate mounted on one of the first and second tables is moved in the first area while the one table is held by a first movable member. A substrate mounted on another of the first and second tables is moved in the second area while the another table is held by a second movable member. The tables held by the first and second movable members are driven so that the another table is moved from the second to the first movable member to be held in place of the one table.
Public/Granted literature
- US20130250257A1 EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD Public/Granted day:2013-09-26
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