Invention Grant
US08717568B2 Analyzing particle quantity and/or distribution within an assay analysis system
有权
分析测定分析系统中的颗粒数量和/或分布
- Patent Title: Analyzing particle quantity and/or distribution within an assay analysis system
- Patent Title (中): 分析测定分析系统中的颗粒数量和/或分布
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Application No.: US13184100Application Date: 2011-07-15
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Publication No.: US08717568B2Publication Date: 2014-05-06
- Inventor: Nicolas Arab
- Applicant: Nicolas Arab
- Applicant Address: US TX Austin
- Assignee: Luminex Corporation
- Current Assignee: Luminex Corporation
- Current Assignee Address: US TX Austin
- Agency: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.
- Main IPC: G01N21/25
- IPC: G01N21/25 ; G01B11/06 ; G06K9/00

Abstract:
Methods, storage mediums and systems (MS&S) are provided which successively image an imaging region of an assay analysis system (AAS) as particles are loaded into the imaging region, generate a frequency spectrum of each image via a discrete Fourier transform, integrate a same coordinate portion of each frequency spectrum and terminate the loading of particles upon computing an integral which meets preset criterion. In addition, MS&S are provided which send a signal indicative of whether enough particles are in an imaging region for further processes by an AAS based on the magnitude of integral calculated from an image's frequency spectrum. MM&S are also provided such that the steps of generating a frequency spectrum of each image and integrating a portion of each frequency spectrum are replaced by generating a convolved spatial image with a filter kernel and integrating a same coordinate portion of each convolved spatial image.
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