Invention Grant
- Patent Title: Optical measurement apparatus and optical measurement system
- Patent Title (中): 光学测量仪器和光学测量系统
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Application No.: US13868365Application Date: 2013-04-23
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Publication No.: US08717571B2Publication Date: 2014-05-06
- Inventor: Hideyuki Takaoka , Kazuhiro Gono , Takeshi Suga
- Applicant: Olympus Corporation , Olympus Medical Systems Corp.
- Applicant Address: JP Tokyo JP Tokyo
- Assignee: Olympus Corporation,Olympus Medical Systems Corporation
- Current Assignee: Olympus Corporation,Olympus Medical Systems Corporation
- Current Assignee Address: JP Tokyo JP Tokyo
- Agency: Oliff PLC
- Main IPC: G01B9/00
- IPC: G01B9/00 ; G01N21/25 ; G01N21/55

Abstract:
An optical measurement apparatus includes a connector where a base end portion of a measurement probe introduced into a subject is connected, a light source unit that emits illumination light irradiated from a leading end of the measurement probe, an optical measurement unit that measures reflection light and/or scattering light of the illumination light incident through the measurement probe, a first optical path that transmits the illumination light emitted by the light source unit to the optical measurement unit, a second optical path that transmits, to the measurement probe, the illumination light emitted by the light source unit and transmits, to the optical measurement unit, reflection light and/or scattering light of the illumination light incident through the measurement probe, and an optical path switching unit that switches an optical path for transmitting the illumination light into the first optical path or the second optical path.
Public/Granted literature
- US20130271768A1 OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT SYSTEM Public/Granted day:2013-10-17
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