Invention Grant
US08717576B2 Short coherence interferometer 有权
短相干干涉仪

Short coherence interferometer
Abstract:
A short coherence interferometer apparatus for measuring multiple axially spaced regions of a specimen, in particular the eye, which has at least one measuring beam path, through which multiple individual measuring beams are incident on the specimen, and one reference beam path, through which a reference beam runs, with which the individual measuring beams are superimposed and brought into interference. The individual measuring beams are axially offset to one another upon incidence on the specimen by an amount which is adapted to the axial spacing. The interferometer apparatus superimposes each individual measuring beam with the reference beam in an interfering manner and conducts it to a detector associated with the particular individual measuring beam. The individual measuring beams are combined into a mixture in which they have varying phasing in the superposition with the reference beam.
Public/Granted literature
Information query
Patent Agency Ranking
0/0