Invention Grant
- Patent Title: Short coherence interferometer
- Patent Title (中): 短相干干涉仪
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Application No.: US12680722Application Date: 2008-09-26
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Publication No.: US08717576B2Publication Date: 2014-05-06
- Inventor: Martin Hacker
- Applicant: Martin Hacker
- Applicant Address: DE Jena
- Assignee: Carl Zeiss Meditec AG
- Current Assignee: Carl Zeiss Meditec AG
- Current Assignee Address: DE Jena
- Agency: Patterson Thuente Pedersen, P.A.
- Priority: DE102007046507 20070928
- International Application: PCT/EP2008/008230 WO 20080926
- International Announcement: WO2009/043557 WO 20090409
- Main IPC: G01B9/02
- IPC: G01B9/02

Abstract:
A short coherence interferometer apparatus for measuring multiple axially spaced regions of a specimen, in particular the eye, which has at least one measuring beam path, through which multiple individual measuring beams are incident on the specimen, and one reference beam path, through which a reference beam runs, with which the individual measuring beams are superimposed and brought into interference. The individual measuring beams are axially offset to one another upon incidence on the specimen by an amount which is adapted to the axial spacing. The interferometer apparatus superimposes each individual measuring beam with the reference beam in an interfering manner and conducts it to a detector associated with the particular individual measuring beam. The individual measuring beams are combined into a mixture in which they have varying phasing in the superposition with the reference beam.
Public/Granted literature
- US20100284021A1 SHORT COHERENCE INTERFEROMETER Public/Granted day:2010-11-11
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