Invention Grant
- Patent Title: System for calibrating an electronic lapping guide for a beveled pole in a magnetic recording transducer
- Patent Title (中): 用于校准磁记录传感器中斜面极的电子研磨导轨的系统
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Application No.: US13625270Application Date: 2012-09-24
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Publication No.: US08717709B1Publication Date: 2014-05-06
- Inventor: Changqing Shi , Ming Jiang
- Applicant: Western Digital (Fremont), LLC
- Applicant Address: US CA Fremont
- Assignee: Western Digital (Fremont), LLC
- Current Assignee: Western Digital (Fremont), LLC
- Current Assignee Address: US CA Fremont
- Main IPC: G11B5/127
- IPC: G11B5/127

Abstract:
A wafer comprises a transducer having an air-bearing surface (ABS) and including a magnetic structure characterized by a desired thickness, and having a bevel and a flare point a first distance from the ABS. The wafer further comprises a first electronic lapping guide (ELG), a second ELG, and a third ELG. The first ELG has a first edge a first distance from the ABS and a second edge a second distance from the ABS. The second ELG has a third edge a third distance from the ABS and a fourth edge the second distance from the ABS. The third ELG has a fifth edge a fourth distance from the ABS and a sixth edge the second distance from the ABS. At least one of the first distance and the second distance, at least one of the third distance and the second distance, and at least one of the fourth distance and the second distance correspond to an intersection between the bevel and the desired thickness.
Information query
IPC分类: