Invention Grant
US08717802B2 Reconfigurable multi-level sensing scheme for semiconductor memories 有权
用于半导体存储器的可重构多电平感测方案

Reconfigurable multi-level sensing scheme for semiconductor memories
Abstract:
A method for sensing at least one parameter indicative of a logical state of a multi-level memory cell includes the steps of: measuring the parameter of the multi-level memory cell; comparing the measured parameter of the multi-level memory cell with a prescribed reference signal, the reference signal having a value which varies as a function of time; and storing a time value corresponding to a point in time at which the reference signal is substantially equal to the measured parameter of the multi-level memory cell, the stored time value being indicative of a sensed logical state of the multi-level memory cell.
Information query
Patent Agency Ranking
0/0