Invention Grant
- Patent Title: Estimation of memory cell wear level based on saturation current
- Patent Title (中): 基于饱和电流估计存储单元磨损水平
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Application No.: US13710938Application Date: 2012-12-11
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Publication No.: US08717826B1Publication Date: 2014-05-06
- Inventor: Eyal Gurgi , Naftali Sommer , Yael Shur
- Applicant: Apple Inc.
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agency: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.
- Main IPC: G11C11/34
- IPC: G11C11/34
Abstract:
A method includes measuring a saturation current flowing through one or more analog memory cells. A wear level of the memory cells is deduced from the measured saturation current. Storage of data in the memory cells is configured based on the deduced wear level.
Information query
