Invention Grant
US08717829B2 System and method for soft error detection in memory devices 有权
存储器件中软错误检测的系统和方法

System and method for soft error detection in memory devices
Abstract:
A system for detecting soft errors in a memory device includes a latch, a master flip-flop and a slave flip-flop. The latch receives input data (control and/or address signals) at the beginning of a memory operation in response to a rising edge of a first clock signal. The output of the latch is provided to the master flip-flop. The master flip-flop continuously receives and stores the latch output during the memory operation based on a second clock signal. The slave flip-flop receives and stores the output of the master flip-flop at the end of the memory operation based on the second clock signal. A comparator compares the input data with the output of the slave flip-flop to detect soft errors that occur during the memory operation.
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