Invention Grant
- Patent Title: System and method for soft error detection in memory devices
- Patent Title (中): 存储器件中软错误检测的系统和方法
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Application No.: US13532804Application Date: 2012-06-26
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Publication No.: US08717829B2Publication Date: 2014-05-06
- Inventor: Ashish Sharma , James B. Eifert , Amit Kumar Gupta , Thomas W. Liston , Jehoda Refaeli
- Applicant: Ashish Sharma , James B. Eifert , Amit Kumar Gupta , Thomas W. Liston , Jehoda Refaeli
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent Charles Bergere
- Main IPC: G11C7/10
- IPC: G11C7/10

Abstract:
A system for detecting soft errors in a memory device includes a latch, a master flip-flop and a slave flip-flop. The latch receives input data (control and/or address signals) at the beginning of a memory operation in response to a rising edge of a first clock signal. The output of the latch is provided to the master flip-flop. The master flip-flop continuously receives and stores the latch output during the memory operation based on a second clock signal. The slave flip-flop receives and stores the output of the master flip-flop at the end of the memory operation based on the second clock signal. A comparator compares the input data with the output of the slave flip-flop to detect soft errors that occur during the memory operation.
Public/Granted literature
- US20130343133A1 SYSTEM AND METHOD FOR SOFT ERROR DETECTION IN MEMORY DEVICES Public/Granted day:2013-12-26
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