Invention Grant
US08717839B2 Semiconductor device having plural penetration electrodes penetrating through semiconductor substrate and testing method thereof 失效
具有穿透半导体衬底的多个穿透电极的半导体器件及其测试方法

Semiconductor device having plural penetration electrodes penetrating through semiconductor substrate and testing method thereof
Abstract:
Disclosed herein is a device that includes first and second current paths, first and second latch circuits electrically connected to the first and second current paths, respectively, a driver circuit supplying first data to the first latch circuit, and supplying second data representing a logical value opposite to a logical value of the first data to the second latch circuit, a control circuit controlling the driver circuit to be alternately and repeatedly in a first period in which the driver circuit supplies the first data to the first latch circuit and does not supply the second data to the second latch circuit, and in a second period in which the driver circuit supplies the second data to the second latch circuit and does not supply the first data to the first latch circuit, and a monitor circuit.
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