Invention Grant
- Patent Title: Sketch recognition system
- Patent Title (中): 素描识别系统
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Application No.: US13310182Application Date: 2011-12-02
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Publication No.: US08718375B2Publication Date: 2014-05-06
- Inventor: Tom Yu Ouyang , Randall Davis
- Applicant: Tom Yu Ouyang , Randall Davis
- Applicant Address: US MA Cambridge
- Assignee: Massachusetts Institute of Technology
- Current Assignee: Massachusetts Institute of Technology
- Current Assignee Address: US MA Cambridge
- Agency: Hamilton Brook Smith & Reynolds PC
- Main IPC: G06K9/00
- IPC: G06K9/00

Abstract:
Handwriting interpretation tools, such as optical character recognition (OCR), have improved over the years such that OCR is a common tool in business for interpreting typed text and sometimes handwritten text. OCR does not apply well to non-text-only diagrams, such as chemical structure diagrams. A method according to an embodiment of the present invention of interpreting a human-drawn sketch includes determining a local metric indicating whether a candidate symbol belongs to a certain classification based on a set of features. The set of features includes, as a feature, scores generated from feature images of the candidate symbol. Also included is determining a joint metric of multiple candidate symbols based on their respective classifications and interpreting the sketch as a function of the local and joint metrics. Sketches can be chemical composition, biological composition, electrical schematic, mechanical, or any other science- or engineering-based diagrams for which human-drawn symbols have well-known counterparts.
Public/Granted literature
- US20120141032A1 SKETCH RECOGNITION SYSTEM Public/Granted day:2012-06-07
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