Invention Grant
- Patent Title: Positional measurement of a feature within an image
- Patent Title (中): 图像中特征的位置测量
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Application No.: US10532438Application Date: 2003-10-23
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Publication No.: US08718403B2Publication Date: 2014-05-06
- Inventor: Kevin David Potter , Christopher Setchell
- Applicant: Kevin David Potter , Christopher Setchell
- Applicant Address: GB Bristol
- Assignee: Imetrum Limited
- Current Assignee: Imetrum Limited
- Current Assignee Address: GB Bristol
- Agency: Gardere Wynne Sewell LLP
- Priority: GB0224923.3 20021025
- International Application: PCT/GB03/04606 WO 20031023
- International Announcement: WO2004/038328 WO 20040506
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/36 ; G06K9/64 ; G06K9/68 ; H04N5/253 ; H04N7/18 ; G01B11/14 ; G06F15/00 ; G06K1/00 ; H04N1/04

Abstract:
The position of a feature within an image is determined by determining an initial estimate of the feature position to within a fraction of a pixel, translating the feature by an amount equal to that fraction of a pixel, determining a further estimate of the translated feature position to within a fraction of a pixel and summing the pixel fraction of the previous estimate with the further estimate of the position to arrive at a refined estimate of the feature position.
Public/Granted literature
- US20060115133A1 Positional measurement of a feature within an image Public/Granted day:2006-06-01
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