Invention Grant
- Patent Title: Position and orientation measurement apparatus, position and orientation measurement method, and program
- Patent Title (中): 位置和方向测量装置,位置和方向测量方法以及程序
-
Application No.: US13517164Application Date: 2011-02-23
-
Publication No.: US08718405B2Publication Date: 2014-05-06
- Inventor: Masakazu Fujiki , Shinji Uchiyama
- Applicant: Masakazu Fujiki , Shinji Uchiyama
- Applicant Address: JP Tokyo
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP Tokyo
- Agency: Fitzpatrick, Cella, Harper & Scinto
- Priority: JP2010-043059 20100226
- International Application: PCT/JP2011/054677 WO 20110223
- International Announcement: WO2011/105615 WO 20110901
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/32

Abstract:
A position and orientation measurement apparatus for measuring the position and orientation of a target object includes a first search unit which searches a geometric model for a lost model region corresponding to a lost image region in a range image, a determination unit which determines whether or not a point on a geometric model corresponding to a pixel on the range image of the target object falls within the lost model region, a correction unit which corrects combinations of pixels on the range image and corresponding points which are determined to fall within the lost model region, and a calculation unit which calculates the position and orientation of the target object based on the corrected combinations of the pixels on the range image and points on the geometric model.
Public/Granted literature
- US20120275654A1 POSITION AND ORIENTATION MEASUREMENT APPARATUS, POSITION AND ORIENTATION MEASUREMENT METHOD, AND PROGRAM Public/Granted day:2012-11-01
Information query