Invention Grant
US08718967B2 Flexible storage interface tester with variable parallelism and firmware upgradeability
有权
灵活的存储接口测试仪具有可变的并行性和固件升级能力
- Patent Title: Flexible storage interface tester with variable parallelism and firmware upgradeability
- Patent Title (中): 灵活的存储接口测试仪具有可变的并行性和固件升级能力
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Application No.: US13499637Application Date: 2011-05-18
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Publication No.: US08718967B2Publication Date: 2014-05-06
- Inventor: Scott Filler , Hendrik Jan (Erik) Volkerink , Ahmed Sami Tantawy
- Applicant: Scott Filler , Hendrik Jan (Erik) Volkerink , Ahmed Sami Tantawy
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agent Manuel de la Cerra
- International Application: PCT/US2011/036899 WO 20110518
- International Announcement: WO2011/149725 WO 20111201
- Main IPC: G01R31/319
- IPC: G01R31/319 ; G01R31/28 ; G06F11/263 ; G06F11/273 ; G06F17/00 ; G11C29/56
Abstract:
A system for use in automated test equipment. In one embodiment, the system includes a configurable integrated circuit (IC) programmable to provide test patterns for use in automated test equipment. The configurable IC includes a configurable interface core that is programmable to provide functionality of one or more protocol based interfaces for a device under test (DUT) and is programmable to interface with the DUT. The system also includes a connection configurable to couple the configurable IC to the DUT.
Public/Granted literature
- US20120191402A1 FLEXIBLE STORAGE INTERFACE TESTER WITH VARIABLE PARALLELISM AND FIRMWARE UPGRADEABILITY Public/Granted day:2012-07-26
Information query
IPC分类:
