Invention Grant
- Patent Title: Self-diagnosis system and test circuit determination method
- Patent Title (中): 自诊断系统和测试电路的确定方法
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Application No.: US13086852Application Date: 2011-04-14
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Publication No.: US08719650B2Publication Date: 2014-05-06
- Inventor: Masafumi Matsuo
- Applicant: Masafumi Matsuo
- Applicant Address: JP Kanagawa
- Assignee: Renesas Electronics Corporation
- Current Assignee: Renesas Electronics Corporation
- Current Assignee Address: JP Kanagawa
- Agency: Sughrue Mion, PLLC
- Priority: JP2010-099582 20100423
- Main IPC: G01R31/28
- IPC: G01R31/28

Abstract:
Provided are a self-diagnosis system and a test circuit determination method that are capable of determining normality of a test circuit which diagnoses a test target circuit. A self-diagnosis system according to an aspect of the present invention includes a test circuit including first and second diagnosis controllers which determine normality of a test target circuit by using an execution result of a test pattern in the test target circuit; and a test circuit determination unit which determines normality of the test circuit by comparing a normality determination result of the test target circuit output from the first diagnosis controller with a normal determination result of the test target circuit output from the second diagnosis controller.
Public/Granted literature
- US20110264972A1 SELF-DIAGNOSIS SYSTEM AND TEST CIRCUIT DETERMINATION METHOD Public/Granted day:2011-10-27
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