Invention Grant
- Patent Title: Memory device with error detection
- Patent Title (中): 具有错误检测的存储器
-
Application No.: US13007923Application Date: 2011-01-17
-
Publication No.: US08719662B2Publication Date: 2014-05-06
- Inventor: David Eggleston , Bill Radke
- Applicant: David Eggleston , Bill Radke
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Schwegman, Lundberg & Woessner, P.A.
- Main IPC: G11C29/00
- IPC: G11C29/00

Abstract:
Data move operations in a memory device are described that enable identification of data errors. Error detection circuitry in the memory device can be operated using parity data or ECC data stored in the memory. Results of the error detection can be accessed by a memory controller for data repair operations by the controller.
Public/Granted literature
- US20110113306A1 MEMORY DEVICE WITH ERROR DETECTION Public/Granted day:2011-05-12
Information query