Invention Grant
- Patent Title: Method and system for test reduction and analysis
- Patent Title (中): 测试减少和分析的方法和系统
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Application No.: US12568005Application Date: 2009-09-28
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Publication No.: US08719771B2Publication Date: 2014-05-06
- Inventor: Meir Ovadia , Marat Teplitsky , Rodion Melnikov
- Applicant: Meir Ovadia , Marat Teplitsky , Rodion Melnikov
- Applicant Address: US CA San Jose
- Assignee: Cadence Design Systems, Inc.
- Current Assignee: Cadence Design Systems, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Vista IP Law Group, LLP
- Main IPC: G06F9/44
- IPC: G06F9/44

Abstract:
Disclosed is a method, system, and computer program product that reduces the size of a failing test. A tree is created from the test's programming code, where the tree represents the syntactical and the semantic bounds between the programming code elements. By analyzing this tree and iteratively pruning the irrelevant sub-trees it is possible to eliminate many non necessary parts of the code, and recreate a new legal test, which represents the same error, but is potentially much smaller and therefore easier to understand and debug.
Public/Granted literature
- US20110078651A1 METHOD AND SYSTEM FOR TEST REDUCTION AND ANALYSIS Public/Granted day:2011-03-31
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