Invention Grant
- Patent Title: Parametric trace slicing
- Patent Title (中): 参数跟踪切片
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Application No.: US13012133Application Date: 2011-01-24
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Publication No.: US08719796B2Publication Date: 2014-05-06
- Inventor: Grigore Rosu , Feng Chen , Patrick O. Meredith
- Applicant: Grigore Rosu , Patrick O. Meredith , Guo-fang Chen , Yamei Wu
- Applicant Address: US IL Urbana
- Assignee: The Board of Trustees of the University of Illinois
- Current Assignee: The Board of Trustees of the University of Illinois
- Current Assignee Address: US IL Urbana
- Agency: Wolfe-SBMC
- Main IPC: G06F9/44
- IPC: G06F9/44

Abstract:
A program trace is obtained and events of the program trace are traversed. For each event identified in traversing the program trace, a trace slice of which the identified event is a part is identified based on the parameter instance of the identified event. For each trace slice of which the identified event is a part, the identified event is added to an end of a record of the trace slice. These parametric trace slices can be used in a variety of different manners, such as for monitoring, mining, and predicting.
Public/Granted literature
- US20110320878A1 Parametric Trace Slicing Public/Granted day:2011-12-29
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